Telcordia software to calculate the reliability prediction of electronic equipment based on the Telcordia (Bellcore) TR and SR standards. Free trial. Telcordia Telecom Information SuperStore – Reliability Prediction Procedure for The following documents were fully or partly replaced by SR TR Bellcore TR – Download as PDF File .pdf), Text File .txt) or read online.

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Bellcore/Telcordia Reliability Prediction in Lambda Predict

This approach is based upon an understanding of the physical properties of the materials, operation processes and technologies used in the design. Yr-332 current density J and temperature T are factors in the design process that affect electromigration.

Powerful and user friendly Telcordia telecom standard reliability prediction software. The activation energy is usually related to certain failure mechanisms and failure modes, and can be determined by correlating thermal cycling test data and the Coffin-Manson model. So the result of 0. Method III is a statistical prediction of failure rate based on field tracking data collected in accordance with specific SR criteria.

These powerful facilities transfer as much of the available information as possible, saving bellcre valuable time and effort. The Black model employs external heating and increased current density and is given by:. According to different physics of failure mechanisms, one more term i. Accurate prediction of the reliability of electronic products requires knowledge of the components, the design, the manufacturing process and the expected operating conditions.

Parts Count Method II: Since electronic products usually have a long time period of useful life i. Permanent damage accumulates each time the device experiences a normal power-up and power-down cycle. The usage temperature level is Kelvin.

Revised generic device failure rates in Section 8, bellcoe mainly on new data for many components. It contains instructions for suppliers to follow when providing predictions of their device, unit, or serial system reliability.


Times-to-failure are recorded and then analyzed with an appropriate statistical distribution in order to estimate reliability metrics such as the B10 life. For example, for the Weibull distribution, the life characteristic is the scale parameter eta and for the lognormal distribution, it is the log mean.

The table below lists some of the available prediction standards and the following sections describe two of the most commonly used methods in a bit more detail. Features Powerful and user friendly Telcordia telecom standard reliability prediction software Combine prediction methods for complex analysis Optimize designs to meet targeed goals Select components with regard to reliability and cost savings Be more accurate and efficient than with manual methods Belkcore advantage bellfore powerful tr-3322 if’ analytical tools Identify weakareas in a system design Build and open multiple systems and projects files Drag and drop components and systems between projects Powerful charting facilities.

SR – Reliability Prediction Procedure | Telcordia

If the parameters cannot be determined without conducting a test, the failure data obtained from the test can be used to get the model parameters.

Numerous experiments with different stress conditions have been reported in the literature, where the values have been reported in the range between 2 and vellcore.

The failure rate for parts under specific operating conditions can be calculated as:. The model takes the following form.

Bellcore/Telcordia Reliability Prediction in Lambda Predict

After the analysis is complete, ITEM ToolKit’s integrated environment comes into bellcoore own with powerful conversion facilities for transferring data to other modules of the program.

In this article, we discussed three approaches for electronic reliability prediction. Issue 4 of SR provides the only hardware reliability prediction procedure developed from the input and participation of a cross-section of major industrial companies. However, if you bellcore your products do not exhibit a constant failure rate and therefore cannot be described by an exponential distribution, the life characteristic usually will not be the MTBF.


Notice 1 and Notice 2 Electromigration is a failure mechanism that results from the transfer of momentum from the electrons, which move in the applied electric field, to the ions, which make up the lattice of the interconnect material. The models allow reliability prediction to be performed using three methods for predicting bellcore reliability: Reliability and Maintainability Symp.

Click to Request Price Quote. The advantages and disadvantages of empirical methods have been discussed a lot in the past three decades. For this example, the life of an electronic component is considered to be affected by temperature.

Bellcore/Telcordia Predictions

The parts count method assumes typical operating conditions of part complexity, ambient temperature, various electrical stresses, operation mode and environment called reference conditions. Once the prototype of a product is available, lab tests can be utilized to obtain more accurate reliability predictions. In today’s competitive electronic products market, having higher bellcorr than competitors is one of the key factors for success.

The models allow reliability prediction to be performed using three methods for predicting product reliability: Issue 4 of SR contains: The assumption is made that system or equipment failure causes are inherently linked to components whose failures are independent of each other.

This lends the procedure and the predictions derived from it a high level of credibility free from the bias of any individual supplier or service provider. This leads to the concept of reliability prediction. On Reliabilityvol.

Telcordia continues to revise and update the standard. It can also be used for: The physics of failure and life testing methods can be used in both design and production stages.